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Authors: M. Cioni, P. Fiorenza, F. Roccaforte, M. Saggio, S. Cascino, A. Messina, V. Vinciguerra, M. Calabretta, A. Chini
Journal title: IEEE International Reliability Physics Symposium (IRPS2022)
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/irps48227.2022.9764543
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