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Authors: Haytham Hijazi, José Cruz, João Castelhano, Ricardo Couceiro, Miguel Castelo-Branco, Paulo de Carvalho, Henrique Madeira
Journal title: 2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE)
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/issre52982.2021.00056
ISBN: 978-1-6654-2588-9
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