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Authors: F. Chiocchetta; C. De Santi; F. Rampazzo; K. Mukherjee; Jan Grünenpütt; Daniel Sommer; Hervé Blanck; Benoit Lambert; A. Gerosa; G. Meneghesso; E. Zanoni; M. Meneghini
Journal title: 2022 IEEE International Reliability Physics Symposium (IRPS)
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/irps48227.2022.9764510
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