Impact of Soft- and Hard-Switching transitions on VTH and RON Drifts in packaged SiC MOSFETs

Summary

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: M. Cioni and A. Chini

Journal title: IEEE

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/wipda49284.2021.9645124