Failure physics and reliability of GaN-based HEMTs for microwave and millimeter-wave applications: a review of consolidated data and recent results

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Enrico Zanoni, Fabiana Rampazzo, Carlo De Santi, Veronica Gao Zhan, Chandan Sharma, Nicola Modolo, Giovanni Verzellesi, Alessandro Chini, Gaudenzio Meneghesso, Matteo Meneghini

Journal title: Physic Status Solid a

Journal publisher: Editor-in-Chief: Stefan Hildebrandt, Deputy Editor: Marc Zastrow Online ISSN: 1862-6319 © Wiley-VCH GmbH, Weinheim

Published year: 2022

DOI identifier: 10.1002/pssa.202100722

ISSN: 1862-6319