Back-Gate Lumped Resistance Effect on AC Characteristics of FD-SOI MOSFET

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Authors: M. Vanbrabant, et al

Journal title: vol. 32, no. 6, pp. 704-707

Journal publisher: in IEEE Microwave and Wireless Components Letter

Published year: 2022

DOI identifier: 10.1109/lmwc.2022.3162497