22 nm FD-SOI MOSFET Figures of Merit at high temperatures upto 175 °C

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Authors: A. Halder, L. Nyssens, M. Rack, D. Lederer, V. Kilchytska and J.-P. Raskin

Journal publisher: 2022 IEEE 22nd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)

Published year: 2022

DOI identifier: 10.1109/sirf53094.2022.9720052