Stress analysis by XRD and Raman on different semiconductor substrates

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Authors: L.B. Enache, G. Mihai, S. Rosoiu, A.G. Pantazi, C. Moise, A.A. Messina, M. Enachescu

Journal publisher: "9th INTERM 2022 ""International Congress on Microscopy & Spectroscopy"", Muğla Province, Turkey"

Published year: 2022