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Authors: Anoldo Laura; Malta Giuliana; Mazza Bruna; Piccione Giuseppe Gabriele; Calabretta Michele; Russo Sebastiano; Russo Alfio; Sitta Alessandro; Messina Angelo; Lionetto Antonio; Patanè Salvatore
Journal title: Microelectronics Reliability
Journal number: 1,418 ;2022
Journal publisher: Elsevier BV
Published year: 2022
DOI identifier: 10.1016/j.microrel.2022.114700
ISSN: 0026-2714
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