Monitoring Degradation of Insulated Gate Bipolar Transistors in Induction Cooktops by Artificial Neural Networks

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Authors: Chenyang Lai, Piero Baralid, Ibrahim Ahmed, Enrico Zio, Alejandro del Cueto, Javier Gil, Sergio Llorente

Journal title: Proceedings of the 32nd European Safety and Reliability Conference (ESREL)

Journal publisher: Research Publishing, Singapore

Published year: 2022