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Authors: N. Modoloa, M. Fregolent, F. Masin, A. Benato, A. Bettini, M. Buffolo, C. De Santi, M. Borga, N. Posthuma, B. Bakeroot, S. Decoutere, D. Vogrig, A. Neviani, G. Meneghesso, E. Zanoni, M. Meneghini
Journal title: Microelectronics Reliability
Journal number: 00262714
Journal publisher: Elsevier BV
Published year: 2022
DOI identifier: 10.1016/j.microrel.2022.114708
ISSN: 0026-2714
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