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Authors: J. Minguet Lopez, F. Rummens, L. Reganaz, A. Heraud, T. Hirtzlin, L. Grenouillet, G. Navarro M. Bernard, C. Carabasse, N. Castellani, V. Meli, S. Martin, T. Magis, E. Vianello, C. Sabbione, D. Deleruyelle, M. Bocquet, J. M. Portal, G. Molas, F. Andrieu
Journal title: 2022 IEEE International Memory Workshop (IMW)
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/imw52921.2022.9779253
ISBN: 978-1-6654-9947-7