A BERT-Based Report Classification for Semiconductor Failure Analysis

Summary

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Corinna Grabner; Anna Safont-Andreu; Christian Burmer; Konstantin Schekotihin

Journal publisher: ISTFA 2022 - International Symposium for Testing and Failure Analysis

Published year: 2022

DOI identifier: 10.31399/asm.cp.istfa2022p0028