Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network

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Authors: Francisco López de la Rosa, José L. Gómez-Sirvent, Roberto Sánchez-Reolid, Rafael Morales, Antonio Fernández-Caballero,

Journal title: Expert Systems with Applications

Journal number: 09574174

Journal publisher: Pergamon Press Ltd.

Published year: 2022

DOI identifier: 10.1016/j.eswa.2022.117731

ISSN: 0957-4174