Summary
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Authors: S. De, F. Müller, N. Laleni, M. Lederer, Y. Raffel, S. Mojumder, S. Abdulazhanov, T. Ali, S. Dünkel, S. Beyer, K. Seidel, T. Kämpfe
Journal title: IEEE Electron Device Letters
Journal number: 00000000
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/led.2022.3216558
ISSN: 0000-0000