Interfacial Layer Engineering to Enhance Endurance and Noise Immunity of FeFETs for IMC Applications

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Authors: Y. Raffel, S. Thunder, M. Lederer, R. Olivo, R. Hoffmann, L. Pirro, S. Beyer, T. Chohan, P.T. Huang, S. De, T. Kämpfe, K. Seidel, J. Heitman

Journal title: International Conference on IC Design and Technology (ICICDT)

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/icicdt56182.2022.993311