READ-Optimized 28nm HKMG Multi-bit FeFET Synapses for Inference-Engine Applications

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Authors: S. De, F. Müller, H.-H. Le, M. Lederer, Y. Raffel, T. Ali, D. Lu, T. Kämpfe

Journal title: IEEE Journal of the Electron Device Society

Journal number: 21686734

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2022

DOI identifier: 10.1109/jeds.2022.3195119

ISSN: 2168-6734