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Authors: F. Müller , M. Lederer, R. Olivo, A. Reck, T. Ali, K. Seidel, T. Kämpfe
Journal title: IEEE International Symposium on Applications of Ferroelectrics (ISAF)
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/isaf51943.2021.9477384