Crystallographic phase and orientation mapping of ferroelectric HfO2 thin films by transmission Kikuchi diffraction

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: M. Lederer, T. Kämpfe, C. Mart, T. Ali, L. Roy, K. Seidel

Journal title: Dresden Nanoanalysis Symposium (DNS)

Journal publisher: Dresden Nanoanalysis Symposium

Published year: 2019