Summary
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Authors: T. Soliman, F. Müller, T. Kirchner, T. Hoffmann, H. Ganem, E. Karimov, T. Ali, M. Lederer, C. Sudarshan, T. Kämpfe, A. Guntoro, N. Wehn
Journal title: IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2020
DOI identifier: 10.1109/iedm13553.2020.9372124