Semi-empirical and Verilog-A compatible compact model for ferroelectric hysteresis behavior

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Authors: M. Lederer, O. R. Olivo, Y. Nandakishor, de Sourav, K. Seidel, E. Lukas, T. Kämpfe

Journal title: International Conference on Simulation of Semiconductor Processes and Devices

Journal publisher: IEEE

Published year: 2022