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Authors: X. Guo, X. Ma, F. Müller, R. Olivo, J. Wu, K. Ni, T. Kämpfe, Y. Liu, H. Yang, X. Li
Journal title: European Solid State Circuits Conference (ESSCIRC)
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/esscirc53450.2021.9567880