Impact of Temperature on Reliability of MFIS HZO-based Ferroelectric Tunnel Junctions

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Authors: A. Sünbül, T. Ali, Tarek, R. Hoffmann, R. Revello, Y. Raffel, P. Duhan, D. Lehninger, K. Kühnel, M. Rudolph, S. Oehler, P. Schramm, M. Czernohorsky, K. Seidel, T. Kämpfe, L.M. Eng

Journal title: International Reliability Physics Symposium (IRPS)

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/irps48227.2022.9764585