Impact of parasitic wire resistance on accuracy and size of resistive crossbars

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Authors: L. Zhang, D. Borggreve, F. Vanselow, R. Brederlow

Journal title: IEEE International Symposium on Circuits and Systems (ISCAS)

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/iscas51556.2021.9401279