Influence of microstructure on the variability and current percolation paths in ferroelectric hafnium oxide based neuromorphic FeFET synapses

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Authors: M. Lederer, F. Müller, A. Varanasi, R. Olivo, K. Mertens, D. Lehninger, Y. Raffel, R. Hoffmann, T. Ali, K. Seidel, T. Kämpfe, L.M. Eng

Journal title: Silicon Nanoelectronics Workshop (SNW)

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/snw51795.2021.00033