Data-Centric Model Development to Improve the CNN Classification of Defect Density SEM Images

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Authors: C. Kofler, C. A. Dohr, J. Dohr and A. Zernig

Journal title: IECON 2022 – 48th Annual Conference of the IEEE Industrial Electronics Society

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/iecon49645.2022.9968911