A Highly Linear Temperature Sensor Operating up to 600°C in a 4H-SiC CMOS Technology

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Authors: Jiarui Mo; Jinglin Li; Yaqian Zhang; Joost Romijn; Alexander May; Tobias Erlbacher; Guoqi Zhang; Sten Vollebregt

Journal title: IEEE Electron Device Letters

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2023

DOI identifier: 10.1109/led.2023.3268334

ISSN: 0741-3106