A novel approach to analyze the reliability of GaN power HEMTs operating in a DC-DC Buck converter

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Authors: G. Capasso, M. Zanuccoli, A. N. Tallarico and C. Fiegna

Journal title: IEEE 52nd European Solid-State Device Research Conference (ESSDERC)

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1109/essderc55479.2022.9947200