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Authors: Diogo Miguel Caetano, Ruben Afonso, Ana Rita Soares, João Silva, Hanna Iva Busse, Vania Silverio, Taimur Rabuske, Gonçalo N. Tavares, Jorge Ribeiro Fernandes, Susana Cardoso
Journal title: IEEE Transactions on Instrumentation and Measurement ( Volume: 72)
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2023
DOI identifier: 10.1109/tim.2023.3244208
ISSN: 0018-9456
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