The long-term reliability of pre-charged CMUTs for the powering of deep implanted devices

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Authors: Marta Saccher, Shinnosuke Kawasaki, Ronald Dekker

Journal title: 2021 IEEE International Ultrasonics Symposium (IUS)

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/ius52206.2021.9593683

ISBN: 978-1-6654-0355-9