Electrically active defects in power SiC-MOSFET before and after applied electrical stress

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Authors: V. Malik, M. Matus, A. Chvala, J. Marek, V. Vinciguerra, A. A. Messina, L.Stuchlikova

Journal title: ADEPT 2023

Journal publisher: The 11th international conference on Advances in Electronic and Photonic Technologies. Podbanské (Slovakia), 12-15 Jun 2023

Published year: 2023