Electro-thermo-mechanical simulation analysis and optimization of SiC power MOSFET under UIS test condition.

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Authors: CHVÁLA, Aleš - MAREK, Juraj - KOZÁRIK, Jozef - MESSINA, Angelo Alberto - VINCIGUERRA, Vincenzo - DONOVAL, Daniel.

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2022

DOI identifier: 10.1109/asdam55965.2022.9966742

ISSN: 2169-3536