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Authors: Cai, Kl; Van Beek, S.; Rao, S.; Fan, K.; Gupta, M.; Nguyen, V.D.; Jayakumar, G.; Talmelli, G.; Couet, S.; Kar, G.S.
Journal title: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
Journal number: 2
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/vlsitechnologyandcir46769.2022.9830307