Demonstration of 3D sequential FD-SOI on CMOS FinFET stacking featuring low temperature Si layer transfer and top tier device fabrication with tier interconnection

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Authors: A. Vandooren et al.

Journal title: VLSI Symposium

Journal number: June 2022

Journal publisher: VLSI

Published year: 2022

DOI identifier: 10.1109/vlsitechnologyandcir46769.2022.9830400