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Authors: Varun Thukral, Irene Bacquet, Michiel van Soestbergen, Jeroen Zaal, Romuald Roucou, Rene Rongen, Willem D. van Driel, GuoQi Zhang
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.1109/ectc51909.2023.00140
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