Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples

Summary

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Authors: Staeck, S.; Andrle, A.; Hoenicke, P.; Baumann, J.; Groetzsch, D.; Weser, J.; Goetzke, G.; Jonas, A.; Kayser, Y.; Foerste, F.; Mantouvalou, I.; Viefhaus, J.; Soltwisch, V.; Stiel, H.; Beckhoff, B.; Kanngiesser, B.

Journal title: Nanomaterials, Vol 12, Iss 21, p 3766 (2022)

Journal number: 1

Journal publisher: MDPI

Published year: 2022

Published pages: 3766

DOI identifier: 10.3390/nano12213766

ISSN: 2079-4991