Scaling the SOT track – A path towards maximizing efficiency in SOT-MRAM

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Authors: Van Beek, Simon; Cai, Kaiming; Yasin, Farrukh; Hody, Hubert; Talmelli, Giacomo; Nguyen, Van Dai; Trovato, Anna; Franchina, Nathali; Palomino, Alvaro; Wostyn, Kurt; Rao, Siddharth; Kar, Gouri Sankar; Couet, Sebastien

Journal title: 2023 International Electron Devices Meeting (IEDM)

Journal number: 6

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.1109/IEDM45741.2023.10413749

ISSN: 2156-017X