Understanding the impact of split-gate LDMOS transistors: Analysis of performance and hot-carrier-induced degradation

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Authors: Paolo Magnone; Andrea Natale Tallarico; Simone Pistollato; Riccardo Depetro; Giuseppe Croce

Journal title: Solid-State Electronics

Journal number: 108068

Journal publisher: Pergamon Press Ltd.

Published year: 2021

DOI identifier: 10.1016/j.sse.2021.108068

ISSN: 0038-1101