Charge Trapping in GaN Power Transistors: Challenges and Perspectives

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Meneghini, Matteo; Modolo, Nicola; Nardo, Arianna; De Santi, Carlo; Minetto, Andrea; Sayadi, Luca; Koller, Christian; Sicre, Sebastien; Prechtl, Gerhard; Meneghesso, Gaudenzio; Zanoni, Enrico

Journal title: 2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2021

Journal number: 5-8 Dec. 2021

Journal publisher: IEEE

Published year: 2021

DOI identifier: 10.1109/bcicts50416.2021.9682455