Trapping and Reliability in GaN Transistors:Role of Buffer and Hot Electrons

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Authors: M. Meneghini, N. Modolo, A. Nardo, C. De Santi, M. Buffolo, A. Minetto, L. Sayadi, S. Sicre, G. Prechtl, C. Ostermaier, C. Koller, F. Rampazzo, G. Meneghesso, and E. Zanoni

Journal title: Proceedings of the GaN Marathon 2022

Journal publisher: C.L.E.U.P.

Published year: 2022

ISBN: 9788854955271