Degradation of 600V GaN HEMTs under repetitive short circuit conditions.

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Authors: KOZÁRIK, Jozef - MAREK, Juraj - MINÁRIK, Michal - CHVÁLA, Aleš - DEBNÁR, Tomáš - DONOVAL, Martin - STUCHLÍKOVÁ, Ľubica.

Journal title: ISPS '21 : 15th International Seminar on Power Semiconductors

Journal number: August 26-27, 2021

Journal publisher: Czech Technical University in Prague

Published year: 2021

Published pages: 76-81

ISBN: 978-80-01-06874-8