READ-Optimized 28nm HKMG Multibit FeFET Synapses for Inference-Engine Applications

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Authors: Sourav De; Franz Muller; Hoang-Hiep Le; Maximilian Lederer; Yannick Raffel; Tarek Ali; Darsen Lu; Thomas Kampfe

Journal title: IEEE Journal of the Electron Device Society

Journal number: Volume 10

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2022

Published pages: 637 - 641

DOI identifier: 10.1109/jeds.2022.3195119

ISSN: 2168-6734