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Authors: Sourav De; Franz Muller; Hoang-Hiep Le; Maximilian Lederer; Yannick Raffel; Tarek Ali; Darsen Lu; Thomas Kampfe
Journal title: IEEE Journal of the Electron Device Society
Journal number: Volume 10
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2022
Published pages: 637 - 641
DOI identifier: 10.1109/jeds.2022.3195119
ISSN: 2168-6734