Synergistic Approach of Interfacial Layer Engineering and READ-Voltage Optimization in HfO<sub>2</sub>-Based FeFETs for In-Memory-Computing Applications

Summary

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Raffel, Yannick; De, Sourav; Lederer, Maximilian; Olivo, Ricardo Revello; Hoffmann, Raik; Thunder, Sunanda; Pirro, Luca; Beyer, Sven; Chohan, Talha; Kämpfe, Thomas; Seidel, Konrad; Heitmann, Johannes

Journal title: ACS Applied Electronic Materials

Journal number: 4

Journal publisher: ACS

Published year: 2023

Published pages: 5292–5300

DOI identifier: 10.1021/acsaelm.2c00771

ISSN: 2637-6113