From Constraints to Tape-Out: Towards a Continuous AMS Design Flow

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Authors: Andreas Krinke, Tilman Horst, Georg Glaser, Martin Grabmann, Tobias Markus, Benjamin Prautsch, Uwe Hatnik, Jens Lienig

Journal title: 2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

Journal publisher: IEEE

Published year: 2019

Published pages: 1-10

DOI identifier: 10.1109/ddecs.2019.8724669

ISBN:978-1-7281-0073-9

Electronics and ICT as enabler for digital industry and optimized supply chain management covering the entire product lifecycle
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