Design Criteria of High-Temperature Integrated Circuits Using Standard SOI CMOS Process up to 300°C

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Christian Sbrana; Alessandro Catania; Maksym Paliy; Stefano Di Pascoli; Sebastiano Strangio; Massimo Macucci; Giuseppe Iannaccone

Journal title: IEEE Xplore

Journal number: 12

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2024

Published pages: 57236 - 57249

DOI identifier: 10.1109/access.2024.3387714

ISSN: 2169-3536