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Authors: Gusztav Hantos, Janos Hegedus, Andras Poppe
Journal title: 2018 34th Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)
Journal publisher: IEEE
Published year: 2018
Published pages: 63-70
DOI identifier: 10.1109/SEMI-THERM.2018.8357354
ISBN:978-1-5386-4402-7
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