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Authors: B. Kazemi Esfeh, V. Kilchytska, B. Parvais, N. Planes, M. Haond, D. Flandre, J.-P. Raskin
Journal title: 2017 47th European Solid-State Device Research Conference (ESSDERC)
Journal publisher: IEEE
Published year: 2017
Published pages: 148-151
DOI identifier: 10.1109/ESSDERC.2017.8066613
ISBN: 978-1-5090-5978-2
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