Back-gate bias effect on FDSOI MOSFET RF Figures of Merits and parasitic elements

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Authors: B. Kazemi Esfeh, V. Kilchytska, B. Parvais, N. Planes, M. Haond, D. Flandre, J.-P. Raskin

Journal title: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

Journal publisher: IEEE

Published year: 2017

Published pages: 228-230

DOI identifier: 10.1109/ULIS.2017.7962569

ISBN: 978-1-5090-5313-1