Using Electron Diffraction Techniques, CBED and N-PED to measure Strain with High Precision and High Spatial Resolution

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Authors: J.L. Rouviere, Y. Martin, N. Bernier, M. Vigouroux, D. Cooper, J.M. Zuo

Journal title: Microscopy and Microanalysis

Journal number: 21/S3

Journal publisher: Cambridge University Press

Published year: 2015

Published pages: 2209-2210

DOI identifier: 10.1017/S1431927615011824

ISSN: 1431-9276