Strain mapping at the nanoscale using precession electron diffraction in transmission electron microscope with off axis camera

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Authors: M. P. Vigouroux, V. Delaye, N. Bernier, R. Cipro, D. Lafond, G. Audoit, T. Baron, J. L. Rouvière, M. Martin, B. Chenevier, F. Bertin

Journal title: Applied Physics Letters

Journal number: 105/19

Journal publisher: American Institute of Physics

Published year: 2014

Published pages: 191906

DOI identifier: 10.1063/1.4901435

ISSN: 0003-6951